Institut de Ciència de Materials de Barcelona (ICMAB) 19 enero 2015
ICMAB Scientific-Technical Workshop: "AFM Beyond Imaging. Nanoscale Characterization of Functional Materials". Atomic Force Microscopy is one of the most versatile techniques for the nanoscale characterization of a large variety of materials (complex oxides, biopolymers, living cells, organic semiconductors…) More: http://congresses.icmab.es/afm2015